Please use this identifier to cite or link to this item: http://hdl.handle.net/11452/21159
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dc.contributor.authorMemon, Niaz Ahmed-
dc.contributor.authorSankur, Bülent-
dc.date.accessioned2021-07-07T11:32:37Z-
dc.date.available2021-07-07T11:32:37Z-
dc.date.issued2002-09-
dc.identifier.citationAvcıbaş, I. vd. (2002). "Image steganalysis with binary similarity measures". 2002 International Conference On Image Processing, Vol III, Proceedings,3, 645-648.tr_TR
dc.identifier.isbn0-7803-7622-6-
dc.identifier.urihttp://hdl.handle.net/11452/21159-
dc.description.abstractWe present a novel technique for steganalysis of images that have been subjected to Least Significant Bit (LSB) type steganographic algorithms. The seventh and eight bit planes in an image are used for the computation of several binary similarity measures. The basic idea is that, the correlation between the bit planes as well the binary texture characteristics within the bit planes will differ between a stego-image and a cover-image. These telltale marks can be used to construct a steganalyzer, that is, a multivariate regression scheme to detect the presence of a steganographic message in an image.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectComputer scienceen_US
dc.titleImage steganalysis with binary similarity measuresen_US
dc.typeProceedings Paperen_US
dc.identifier.wos000185328900162tr_TR
dc.relation.publicationcategoryKonferans Öğesi - Uluslararasıtr_TR
dc.contributor.departmentUludağ Üniversitesi/Mühendislik Fakültesi/Elektrik Mühendisliği Bölümü.tr_TR
dc.identifier.startpage645tr_TR
dc.identifier.endpage648tr_TR
dc.identifier.volume3tr_TR
dc.relation.journal2002 International Conference On Image Processing, Vol III, Proceedingstr_TR
dc.contributor.buuauthorAvcıbaş, İsmail-
dc.contributor.researcheridH-9089-2018tr_TR
dc.relation.collaborationYurtiçitr_TR
dc.relation.collaborationYurt dışıen_US
dc.subject.wosComputer science artificial intelligenceen_US
dc.subject.wosComputer science, software engineeringen_US
dc.subject.wosComputer Science, information systemsen_US
dc.indexed.wosCPCI-Sen_US
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