Please use this identifier to cite or link to this item: http://hdl.handle.net/11452/24900
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dc.contributor.authorKadirov, O.-
dc.date.accessioned2022-03-08T08:25:44Z-
dc.date.available2022-03-08T08:25:44Z-
dc.date.issued2009-06-
dc.identifier.citationAhmetoğlu, M. vd. (2009). "Photoelectrical properties of InP-InGaAsp heterojunction avalanche photodiodes". Optoelectronics and Advanced Materials, Rapid Communications, 3(6), 608-611.en_US
dc.identifier.issn1842-6573-
dc.identifier.urihttp://hdl.handle.net/11452/24900-
dc.description.abstractPhotoelectrical properties and the spectrum of the avalanche multiplication factor versus the reverse voltage at room temperature have been studied for LPE grown for InP-In(x)Ga(1-x)AsyP(1-y) heterostructures. The tunneling current becomes substantial at peak junction electric fields as low as 10(5) V/m due to the small direct energy gaps and small effective masses of the structures tested. The process of breakdown in the investigated structures was of the avalanche type. The results found for the lowering of the tunneling current in the pre-breakdown region. The temperature coefficient of the breakdown voltage beta = (1/V-B).(dV(B)/dT) > 0 was determined in the temperature range 77-300 K and its value was found to be beta = 5.78 x 10(-4) K-1.en_US
dc.language.isoenen_US
dc.publisherNatl Inst Optoelectronicsen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectHeterostructuresen_US
dc.subjectPhotoelectrical propertiesen_US
dc.subjectThe tunneling currenten_US
dc.subjectPhoto-diodesen_US
dc.subjectPhotodetectoren_US
dc.subjectMaterials scienceen_US
dc.subjectOpticsen_US
dc.subjectElectric fieldsen_US
dc.subjectElectron tunnelingen_US
dc.subjectHeterojunctionsen_US
dc.subjectIII-V semiconductorsen_US
dc.subjectIndium phosphideen_US
dc.subjectSemiconducting indium phosphideen_US
dc.subjectAvalanche multiplication factoren_US
dc.subjectDirect energy gapsen_US
dc.subjectEffective massen_US
dc.subjectPhoto-electrical propertiesen_US
dc.subjectReverse voltagesen_US
dc.subjectTemperature coefficienten_US
dc.subjectTemperature rangeen_US
dc.subjectTunneling currenten_US
dc.subjectTemperatureen_US
dc.titlePhotoelectrical properties of InP-InGaAsp heterojunction avalanche photodiodesen_US
dc.typeArticleen_US
dc.identifier.wos000268723400019tr_TR
dc.identifier.scopus2-s2.0-77951983589tr_TR
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergitr_TR
dc.contributor.departmentUludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü.tr_TR
dc.identifier.startpage608tr_TR
dc.identifier.endpage611tr_TR
dc.identifier.volume3tr_TR
dc.identifier.issue6tr_TR
dc.relation.journalOptoelectronics and Advanced Materials, Rapid Communicationsen_US
dc.contributor.buuauthorAhmetoğlu, Muhitdin-
dc.contributor.buuauthorÖzer, Mehmet-
dc.relation.collaborationYurt dışıtr_TR
dc.subject.wosMaterials science, multidisciplinaryen_US
dc.subject.wosOpticsen_US
dc.indexed.wosSCIEen_US
dc.indexed.scopusScopusen_US
dc.wos.quartileQ4en_US
dc.contributor.scopusid16021109400tr_TR
dc.contributor.scopusid9742545600tr_TR
dc.subject.scopusLiquid Phase Epitaxy; Photoconductive Cells; Light Emitting Diodesen_US
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