Please use this identifier to cite or link to this item: http://hdl.handle.net/11452/31192
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dc.contributor.authorPerdigoto, J. M.C.-
dc.contributor.authorCortez, André F.V.-
dc.contributor.authorNeves, Pedro N.B.-
dc.contributor.authorSantos, Filomena P.-
dc.contributor.authorBorges, F. I.G.M.-
dc.contributor.authorConde, Carlos A.N.-
dc.date.accessioned2023-02-24T07:23:18Z-
dc.date.available2023-02-24T07:23:18Z-
dc.date.issued2017-07-24-
dc.identifier.citationPerdigoto, J. M. C. vd. (2017). ''Experimental ion mobility measurements in Xe-CH4''. Journal of Instrumentation, 12.en_US
dc.identifier.issn1748-0221-
dc.identifier.urihttps://doi.org/10.1088/1748-0221/12/09/P09003-
dc.identifier.urihttps://iopscience.iop.org/article/10.1088/1748-0221/12/09/P09003-
dc.identifier.urihttp://hdl.handle.net/11452/31192-
dc.description.abstractData on ion mobility is important to improve the performance of large volume gaseous detectors. In the present work, the method, experimental setup and results for the ion mobility measurements in Xe-CH4 mixtures are presented. The results for this mixture show the presence of two distinct groups of ions. The nature of the ions depend on the mixture ratio since they are originated by both Xe and CH4. The results here presented were obtained for low reduced electric fields, E/N, 10-25 Td (2.4-6.1 kV.cm(-1).bar 1), at low pressure (8 Torr) (10.6 mbar), and at room temperature.en_US
dc.description.sponsorshipRD51 collaboration/CERN, through the common project "Measurement and calculation of ion mobility of some gas mixtures of interest"en_US
dc.description.sponsorshipPortuguese Foundation for Science and Technology - SFRH/BD/52333/2013en_US
dc.language.isoenen_US
dc.publisherIOP Publishingen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.rightsAtıf Gayri Ticari Türetilemez 4.0 Uluslararasıtr_TR
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectInstruments & instrumentationen_US
dc.subjectCharge transport and multiplication in gasen_US
dc.subjectGaseous detectorsen_US
dc.subjectLon sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))en_US
dc.subjectLonization and excitation processesen_US
dc.subjectTransitionen_US
dc.subjectIonizationen_US
dc.subjectThresholden_US
dc.subjectEnergiesen_US
dc.subjectXeen_US
dc.subjectCyclotronsen_US
dc.subjectElectric fieldsen_US
dc.subjectGas detectorsen_US
dc.subjectLon sourcesen_US
dc.subjectLonization of gasesen_US
dc.subjectMixturesen_US
dc.subjectNegative ionsen_US
dc.subjectPositive ionsen_US
dc.subjectExcitation processen_US
dc.subjectGaseous detectorsen_US
dc.subjectLon Mobilityen_US
dc.subjectLon-mobility measurementsen_US
dc.subjectLarge volumesen_US
dc.subjectLow pressuresen_US
dc.subjectMixture ratioen_US
dc.subjectElectron cyclotron resonanceen_US
dc.titleExperimental ion mobility measurements in Xe-CH4en_US
dc.typeArticleen_US
dc.identifier.wos000409520600003tr_TR
dc.identifier.scopus2-s2.0-85030999372tr_TR
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergitr_TR
dc.contributor.departmentUludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü.tr_TR
dc.identifier.volume12tr_TR
dc.relation.journalJournal of Instrumentationen_US
dc.contributor.buuauthorVeenhof, Robert J.-
dc.relation.collaborationYurt dışıtr_TR
dc.relation.collaborationSanayitr_TR
dc.subject.wosInstruments & instrumentationen_US
dc.indexed.wosSCIEen_US
dc.indexed.scopusScopusen_US
dc.wos.quartileQ3en_US
dc.contributor.scopusid6603742499tr_TR
dc.subject.scopusGas; Neon; Carbon Tetrafluorideen_US
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