Please use this identifier to cite or link to this item: http://hdl.handle.net/11452/21574
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dc.contributor.authorMemon, Niaz Ahmed-
dc.contributor.authorSankur, Bülent-
dc.date.accessioned2021-08-31T11:04:19Z-
dc.date.available2021-08-31T11:04:19Z-
dc.date.issued2001-
dc.identifier.citationAvcıbaş, İ. vd. (2001). "Steganalysis based on image quality metrics". 2001 IEEE Workshop on Multimedia Signal Processing, 517-522.en_US
dc.identifier.urihttps://doi.org/10.1109/MMSP.2001.962785-
dc.identifier.urihttps://ieeexplore.ieee.org/document/962785-
dc.identifier.urihttp://hdl.handle.net/11452/21574-
dc.descriptionBu çalışma, 4. Multimedia Signal Processing Workshop'da bildiri olarak sunulmuştur.tr_TR
dc.description.abstractIn this paper, we present techniques for steganalysis of images that have been potentially subjected to a watermarking algorithm. We show that watermarking schemes leave statistical evidence or structure that can be exploited for detection with the aid of proper selection of image features and multivariate regression analysis. We use some image quality metrics as the feature set to distinguish between watermarked and unwatermarked images and furthermore distinguish between different watermarking techniques. To Identify specific quality measures that provide the best discriminative power, we use analysis of variance (ANOVA) techniques. Multivariate regression analysis Is then used on the selected quality metrics to build an optimal classifier using a set of test images and their blurred versions. Simulation results with a specific feature set and some well-known and publicly available watermarking techniques indicate that our approach is able to accurately distinguish with high accuracy between images marked by different watermarking techniques.en_US
dc.description.sponsorshipIEEE Signal Process Soc, Multimedia Signal Process Tech Commen_US
dc.description.sponsorshipCegetelen_US
dc.description.sponsorshipHitachien_US
dc.description.sponsorshipTexas Instrumentsen_US
dc.description.sponsorshipInst Eurecomen_US
dc.description.sponsorshipTelecom Valley Assocen_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectComputer scienceen_US
dc.titleSteganalysis based on image quality metricsen_US
dc.typeProceedings Paperen_US
dc.identifier.wos000173414700082tr_TR
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergitr_TR
dc.contributor.departmentUludağ Üniversitesi/Mühendislik Fakültesi/Elektrik Mühendisliği Bölümü.tr_TR
dc.identifier.startpage517tr_TR
dc.identifier.endpage522tr_TR
dc.relation.journal2001 IEEE Fourth Workshop On Multimedia Signal Processingen_US
dc.contributor.buuauthorAvcıbaş, İsmail-
dc.contributor.researcheridH-9089-2018tr_TR
dc.relation.collaborationYurtiçitr_TR
dc.subject.wosComputer science, software engineeringen_US
dc.subject.wosComputer science, theory & methodsen_US
dc.indexed.wosCPCISen_US
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