Please use this identifier to cite or link to this item: http://hdl.handle.net/11452/21574
Title: Steganalysis based on image quality metrics
Authors: Memon, Niaz Ahmed
Sankur, Bülent
Uludağ Üniversitesi/Mühendislik Fakültesi/Elektrik Mühendisliği Bölümü.
Avcıbaş, İsmail
H-9089-2018
Keywords: Computer science
Issue Date: 2001
Publisher: IEEE
Citation: Avcıbaş, İ. vd. (2001). "Steganalysis based on image quality metrics". 2001 IEEE Workshop on Multimedia Signal Processing, 517-522.
Abstract: In this paper, we present techniques for steganalysis of images that have been potentially subjected to a watermarking algorithm. We show that watermarking schemes leave statistical evidence or structure that can be exploited for detection with the aid of proper selection of image features and multivariate regression analysis. We use some image quality metrics as the feature set to distinguish between watermarked and unwatermarked images and furthermore distinguish between different watermarking techniques. To Identify specific quality measures that provide the best discriminative power, we use analysis of variance (ANOVA) techniques. Multivariate regression analysis Is then used on the selected quality metrics to build an optimal classifier using a set of test images and their blurred versions. Simulation results with a specific feature set and some well-known and publicly available watermarking techniques indicate that our approach is able to accurately distinguish with high accuracy between images marked by different watermarking techniques.
Description: Bu çalışma, 4. Multimedia Signal Processing Workshop'da bildiri olarak sunulmuştur.
URI: https://doi.org/10.1109/MMSP.2001.962785
https://ieeexplore.ieee.org/document/962785
http://hdl.handle.net/11452/21574
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