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http://hdl.handle.net/11452/26650
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tekin, Nalan | - |
dc.contributor.author | Beyaz, Saadet | - |
dc.contributor.author | Koçkar, Hakan | - |
dc.date.accessioned | 2022-05-24T08:42:07Z | - |
dc.date.available | 2022-05-24T08:42:07Z | - |
dc.date.issued | 2012-01-01 | - |
dc.identifier.citation | Ahmetoğlu, M. vd. (2012). "Electrical properties of poly(ethylene glycol dimethacrylate-n-vinyl imidazole)/single walled carbon nanotubes/n-Si schottky diodes formed by surface polymerization of single walled carbon nanotubes". Thin Solid Films, 520(6), 2106-2109. | en_US |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://doi.org/10.1016/j.tsf.2011.08.066 | - |
dc.identifier.uri | https://www.sciencedirect.com/science/article/pii/S0040609011015707 | - |
dc.identifier.uri | http://hdl.handle.net/11452/26650 | - |
dc.description.abstract | In this paper we report the electrical characteristics of the Schottky diodes formed by surface polymerization of the Poly(ethylene glycol dimethanylate-n-vinyl imidazole)/Single Walled Carbon Nanotubes on n-Si The Single Walled Carbon Nanotubes were synthesized by CVD method. The main electrical properties of the Poly(ethylene glycol dimethanylate-n-vinyl imidazole)/Single Walled Carbon Nanotubes/n-Si have been investigated through the barrier heights, the ideality factors and the impurity density distribution, by using current-voltage and reverse bias capacitance voltage characteristics. Electrical measurements were carried out at room temperature. Poly(ethylene glycol dimethacrylate-n-vinyl imidazole)/Single Walled Carbon Nanotubes/n-Si Schottky diode current-voltage characteristics display low reverse-bias leakage currents and average barrier heights of 0.61 +/- 0.02 eV and 0.72 +/- 0.02 eV obtained from both current-voltage and capacitance-voltage measurements at room temperature, respectively. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Elsevier Science | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Materials science | en_US |
dc.subject | Physics | en_US |
dc.subject | Metal semiconductor-structure | en_US |
dc.subject | Schottky barrier | en_US |
dc.subject | Single walled carbon nanotube | en_US |
dc.subject | N-vinyl imidazole | en_US |
dc.subject | Adsorption | en_US |
dc.subject | Bias voltage | en_US |
dc.subject | Capacitance | en_US |
dc.subject | Carbon | en_US |
dc.subject | Current voltage characteristics | en_US |
dc.subject | Diodes | en_US |
dc.subject | Ethylene | en_US |
dc.subject | Ethylene glycol | en_US |
dc.subject | Leakage currents | en_US |
dc.subject | Polymerization | en_US |
dc.subject | Schottky barrier diodes | en_US |
dc.subject | Semiconducting silicon | en_US |
dc.subject | Semiconducting silicon compounds | en_US |
dc.subject | Semiconductor diodes | en_US |
dc.subject | Silicon | en_US |
dc.subject | Barrier heights | en_US |
dc.subject | Capacitance voltage characteristic | en_US |
dc.subject | Capacitance voltage measurements | en_US |
dc.subject | Current voltage | en_US |
dc.subject | Cvd method | en_US |
dc.subject | Electrical characteristic | en_US |
dc.subject | Electrical measurement | en_US |
dc.subject | Ideality factors | en_US |
dc.subject | Impurity density | en_US |
dc.subject | N-vinyl imidazole | en_US |
dc.subject | Reverse-bias | en_US |
dc.subject | Room temperature | en_US |
dc.subject | Schottky barriers | en_US |
dc.subject | Schottky diodes | en_US |
dc.subject | Single-walled carbon | en_US |
dc.subject | Surface polymerization | en_US |
dc.subject | Single-walled carbon nanotubes (swcn) | en_US |
dc.title | Electrical properties of poly(ethylene glycol dimethacrylate-n-vinyl imidazole)/single walled carbon nanotubes/n-Si schottky diodes formed by surface polymerization of single walled carbon nanotubes | en_US |
dc.type | Article | en_US |
dc.identifier.wos | 000300459200080 | tr_TR |
dc.identifier.scopus | 2-s2.0-84855931323 | tr_TR |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi | tr_TR |
dc.contributor.department | Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü. | tr_TR |
dc.contributor.department | Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Kimya Bölümü. | tr_TR |
dc.identifier.startpage | 2106 | tr_TR |
dc.identifier.endpage | 2109 | tr_TR |
dc.identifier.volume | 520 | tr_TR |
dc.identifier.issue | 6 | tr_TR |
dc.relation.journal | Thin Solid Films | en_US |
dc.contributor.buuauthor | Ahmetoğlu, Muhitdin | - |
dc.contributor.buuauthor | Kara, Ali | - |
dc.contributor.researcherid | AAG-6271-2019 | tr_TR |
dc.relation.collaboration | Yurt içi | tr_TR |
dc.subject.wos | Materials science, multidisciplinary | en_US |
dc.subject.wos | Materials science, coatings & films | en_US |
dc.subject.wos | Physics, applied | en_US |
dc.subject.wos | Physics, condensed matter | en_US |
dc.indexed.wos | SCIE | en_US |
dc.indexed.scopus | Scopus | en_US |
dc.wos.quartile | Q2 | en_US |
dc.contributor.scopusid | 16021109400 | tr_TR |
dc.contributor.scopusid | 7102824859 | tr_TR |
dc.subject.scopus | Schottky Diodes; Thermionic Emission; Interface States | en_US |
Appears in Collections: | Scopus Web of Science |
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