Please use this identifier to cite or link to this item: http://hdl.handle.net/11452/29087
Title: Influence of deposition potential on the electrodeposited Ternary CoFeCu films
Authors: Koçkar, Hakan
Özergin, Ercüment
Karaağaç, Öznur
Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü.
Alper, Mürsel
AAG-8795-2021
7005719283
Keywords: Engineering
Materials science
Physics
Magnetic properties
Fe
Magnetoresistance
Dependence
Alloys
Copper
Crystal structure
Cyclic voltammetry
Deposition
Electrodeposition
Power quality
Saturation magnetization
Scanning electron microscopy
X ray diffraction
X ray spectroscopy
Anisotropic magnetic resistance
Current-time transient
Easy axis of magnetization
Energy dispersive X ray spectroscopy
Magnetoresistance properties
Magnetoresistive property
Polycrystalline titanium
Scanning electron microscope
Cobalt
Issue Date: Jul-2013
Publisher: Springer
Citation: Koçkar, H. vd. (2013). "Influence of deposition potential on the electrodeposited Ternary CoFeCu films". Journal of Materials Science-Materials in Electronics, 24(7), 2562-2567.
Abstract: Ternary CoFeCu films, relating their magnetic and magnetoresistance properties with film composition, surface morphology and the corresponding crystal structure, were investigated in terms of different deposition potentials in electrodeposition. The films were grown on polycrystalline titanium substrates. The potentials were obtained from cyclic voltammetry and the current-time transients were also recorded to control the growth of proper films. From the structural analysis by X-ray diffraction, all films had a face-centred cubic structure and the calculated grain size increased with increasing deposition potential. The film compositions by energy dispersive X-ray spectroscopy revealed that the Co, Fe and Cu contents varied and the scanning electron microscope images disclosed that the film morphologies changed as the deposition potential changed. The saturation magnetization was high and coercivity was low at high deposition potential. The easy axis of magnetization was parallel to the film plane for all films. All films showed anisotropic magnetic resistance and their magnitudes were between 3.2 and 3.8 %. The variations in magnetic and magnetoresistive properties related to the microstructure were attributed to the variation of the film contents caused by deposition potential.
URI: https://doi.org/10.1007/s10854-013-1134-1
https://link.springer.com/article/10.1007/s10854-013-1134-1
http://hdl.handle.net/11452/29087
ISSN: 0957-4522
1573-482X
Appears in Collections:Scopus
Web of Science

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