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http://hdl.handle.net/11452/32648
Başlık: | Effect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers |
Yazarlar: | Koçkar, Hakan Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Anabilim Dalı. 0000-0001-5648-3230 Hacıismailoğlu, Mürşide Şafak Alper, Mürsel AAG-8795-2021 AAH-9719-2021 36482867500 7005719283 |
Anahtar kelimeler: | Chemistry Electrochemistry Instruments & instrumentation Physics Electrodeposition Giant magnetoresistance Multilayers X ray diffraction Co/Cu multilayers Face centered cubic structure Giant magnetoresistances (GMR) GMR Magnetoresistance measurements Magnetoresistance properties Vibrating sample magnetometer VSM Magnetic multilayers Superlattices |
Yayın Tarihi: | Oca-2013 |
Yayıncı: | Amer Scientific Publishers |
Atıf: | Hacıismailoğlu, M. Ş. vd. (2013). “Effect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers”. Sensor Letters, 11(1), Special Issue, 106-109. |
Özet: | Co/Cu multilayers were grown on polycrystalline Cu substrates from a single electrolyte by electrodeposition potentiostatically. The structural, magnetic and magnetoresistance (MR) properties of the multilayers were characterized according to both Co and Cu layer thicknesses. The structural analysis by X-ray diffraction (XRD) showed that all samples have face-centered cubic (fcc) structure with a strong (100) texture. Magnetic characterizations studied by vibrating sample magnetometer (VSM) revealed that the easy axes of the multilayers are parallel to the film plane. From magnetoresistance (MR) measurements, it was observed that all samples exhibited giant magnetoresistance (GMR). The GMR behavior of the multilayers changes depending on the thicknesses of both Co and Cu layers. |
URI: | https://doi.org/10.1166/sl.2013.2798 http://hdl.handle.net/11452/32648 |
ISSN: | 1546-198X 1546-1971 |
Koleksiyonlarda Görünür: | Scopus Web of Science |
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