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Başlık: Effect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers
Yazarlar: Koçkar, Hakan
Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Anabilim Dalı.
0000-0001-5648-3230
Hacıismailoğlu, Mürşide Şafak
Alper, Mürsel
AAG-8795-2021
AAH-9719-2021
36482867500
7005719283
Anahtar kelimeler: Chemistry
Electrochemistry
Instruments & instrumentation
Physics
Electrodeposition
Giant magnetoresistance
Multilayers
X ray diffraction
Co/Cu multilayers
Face centered cubic structure
Giant magnetoresistances (GMR)
GMR
Magnetoresistance measurements
Magnetoresistance properties
Vibrating sample magnetometer
VSM
Magnetic multilayers
Superlattices
Yayın Tarihi: Oca-2013
Yayıncı: Amer Scientific Publishers
Atıf: Hacıismailoğlu, M. Ş. vd. (2013). “Effect of Co and Cu layer thicknesses on characterization of electrodeposited Co/Cu multilayers”. Sensor Letters, 11(1), Special Issue, 106-109.
Özet: Co/Cu multilayers were grown on polycrystalline Cu substrates from a single electrolyte by electrodeposition potentiostatically. The structural, magnetic and magnetoresistance (MR) properties of the multilayers were characterized according to both Co and Cu layer thicknesses. The structural analysis by X-ray diffraction (XRD) showed that all samples have face-centered cubic (fcc) structure with a strong (100) texture. Magnetic characterizations studied by vibrating sample magnetometer (VSM) revealed that the easy axes of the multilayers are parallel to the film plane. From magnetoresistance (MR) measurements, it was observed that all samples exhibited giant magnetoresistance (GMR). The GMR behavior of the multilayers changes depending on the thicknesses of both Co and Cu layers.
URI: https://doi.org/10.1166/sl.2013.2798
http://hdl.handle.net/11452/32648
ISSN: 1546-198X
1546-1971
Koleksiyonlarda Görünür:Scopus
Web of Science

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