Bu öğeden alıntı yapmak, öğeye bağlanmak için bu tanımlayıcıyı kullanınız: http://hdl.handle.net/11452/34473
Başlık: Facet cooling in high-power InGaAs/AlGaAs lasers
Yazarlar: Arslan, Seval
Gündoğdu, Sinan
Demir, Abdullah
Uludağ Üniversitesi/Elektrik Elektronik Mühendisliği Bölümü.
0000-0001-5952-5993
Aydınlı, Atilla
ABI-7535-2020
7005432613
Anahtar kelimeler: Semiconductor lasers
Diode lasers
High power lasers
Catastrophic optical damage
Reliability
Reflectance
Modulation
Temperatures
Reduction
Engineering
Optics
Physics
Aluminum gallium arsenide
Gallium compounds
Reliability
Laser beams
Laser mirrors
Monolithic integrated circuits
Optical waveguides
Photonic devices
Semiconducting indium
Temperature measurement
Waveguides
Catastrophic optical mirror damages
Device reliability
Measurement by laser beam
Monolithic integration
Photonic integrated circuits
Power lasers
Waveguide lasers
Yayın Tarihi: 1-Oca-2019
Yayıncı: IEEE-INST Electrical Electronics Engineers Inc
Atıf: Arslan, S. vd. (2019). "Facet cooling in high-power InGaAs/AlGaAs lasers". IEEE Photonics Technology Letters, 31(1), 94-97.
Özet: Several factors limit the reliable output power of a semiconductor laser under CW operation, such as carrier leakage, thermal effects, and catastrophic optical mirror damage (COMD). Ever higher operating powers may be possible if the COMD can be avoided. Despite exotic facet engineering and progress in non-absorbing mirrors, the temperature rise at the facets puts a strain on the long-term reliability of these diodes. Although thermoelectrically isolating the heat source away from the facets with non-injected windows helps lower the facet temperature, data suggests the farther the heat source is from the facets, the lower the temperature. In this letter, we show that longer non-injected sections lead to cooler windows and biasing this section to transparency eliminates the optical loss. We report on the facet temperature reduction that reaches below the bulk temperature in high power InGaAs/AlGaAs lasers under QCW operation with electrically isolated and biased windows. Acting as transparent optical interconnects, biased sections connect the active cavity to the facets. This approach can be applied to a wide range of semiconductor lasers to improve device reliability as well as enabling the monolithic integration of lasers in photonic integrated circuits.
URI: https://doi.org/10.1109/LPT.2018.2884465
https://ieeexplore.ieee.org/document/8554278
http://hdl.handle.net/11452/34473
ISSN: 1041-1135
1941-0174
Koleksiyonlarda Görünür:Scopus
Web of Science

Bu öğenin dosyaları:
Dosya Açıklama BoyutBiçim 
Aydınlı_2019.pdf621.4 kBAdobe PDFKüçük resim
Göster/Aç


Bu öğe kapsamında lisanslı Creative Commons License Creative Commons