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http://hdl.handle.net/11452/28854
Başlık: | Simulation of displacement damage for silicon avalanche photo-diodes |
Yazarlar: | Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Anabilim Dalı. Kılıç, Adnan Piliçer, Ercan Tapan, İlhan Özmutlu, Emin N. AAH-8769-2021 57210230921 15843878300 54396260200 6507726213 |
Anahtar kelimeler: | Instruments & instrumentation Nuclear science & technology Physics Radiation damage Avalanche photo-diode Geant4 simulation Photodiodes Detectors Niel Diodes Electric properties Electron energy loss spectroscopy Energy dissipation High energy physics Neutrons Radiation damage Radiation detectors Semiconducting silicon compounds Silicon detectors Barrel electromagnetic calorimeters Displacement damages Energy loss GEANT4 simulation Geant4 toolkits Neutron fluences Silicon avalanche Avalanche diodes |
Yayın Tarihi: | 1-Kas-2011 |
Yayıncı: | Elsevier |
Atıf: | Kılıç, A. vd. (2011). "Simulation of displacement damage for silicon avalanche photo-diodes". Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 658(1), 70-72. |
Özet: | The silicon avalanche photo-diodes (APDs) in the CMS barrel electromagnetic calorimeter will be exposed to an integrated neutron fluence of about 2 x 10(13) n/cm(2) over 10 years of operation. High neutron fluences change the electrical properties of silicon detectors. The changes are proportional to the non-ionising energy loss in the APDs. Using the Geant4 toolkit, we have calculated the non-ionising energy loss as well as the rate of generation of primary defects in the APDs, for the expected neutron fluence. |
Açıklama: | Bu çalışma, 12-15 Ekim 2010 tarihleri arasında Florence[İtalya]’da düzenlenen International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices (RESMDD)’da bildiri olarak sunulmuştur. |
URI: | https://doi.org/10.1016/j.nima.2011.05.073 https://www.sciencedirect.com/science/article/pii/S0168900211010801 http://hdl.handle.net/11452/28854 |
ISSN: | 0168-9002 1872-9576 |
Koleksiyonlarda Görünür: | Scopus Web of Science |
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